Publications

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Number of publications matching the search criterion: 8

Journal article (1)

A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks (Jan 2024)
Mohammad Ahmadilivani , Mahdi Taheri , Jaan Raik , Masoud Daneshtalab, Maksim Jenihhin
ACM Computing Surveys (CSUR)

Conference/Workshop Paper (7)

Saffira: a framework for assessing the reliability of systolic-array-based dnn accelerators
Mahdi Taheri , Masoud Daneshtalab, Jaan Raik , Maksim Jenihhin , Salvatore Pappalardo , Joachim Paul , Alberto Bosio
27th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

Analysis and Improvement of Resilience for Long Short-Term Memory Neural Networks (Oct 2023)
Mohammad Ahmadilivani , Jaan Raik , Masoud Daneshtalab, Alar Kuusik
36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023)

Efficient On-device Transfer Learning using Activation Memory Reduction (Sep 2023)
Amin Yoosefi , Seyedhamidreza Mousavi, Masoud Daneshtalab, Mehdi Kargahi
International Conference on Fog and Mobile Edge Computing (FMEC)

Enhancing Fault Resilience of QNNs by Selective Neuron Splitting (Jun 2023)
Mohammad Ahmadilivani , Javid Taheri , Jaan Raik , Maksim Jenihhin , Masoud Daneshtalab
5th IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS) (AICAS 2023)

DeepVigor: Vulnerability Value Ranges and Factors for DNNs' Reliability Assessment
Mohammad Ahmadilivani , Mahdi Taheri , Jaan Raik , Masoud Daneshtalab, Maksim Jenihhin
European Test Symposium 2023 (IEEE ETS)

NeuroPIM: Flexible Neural Accelerator for Processing-in-Memory Architectures (May 2023)
Ali Monavari , Sepideh Fattahi , Mehdi Modarressi , Masoud Daneshtalab
International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors (May 2023)
Mahdi Taheri , Mohammad Ahmadilivani , Maksim Jenihhin , Masoud Daneshtalab, Jaan Raik
International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

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