Publications
Number of publications matching the search criterion: 9
Journal article (1)
A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks (Jan 2024) Mohammad Ahmadilivani , Mahdi Taheri , Jaan Raik , Masoud Daneshtalab, Maksim Jenihhin ACM Computing Surveys (CSUR)
Conference/Workshop Paper (8)
Saffira: a framework for assessing the reliability of systolic-array-based dnn accelerators Mahdi Taheri , Masoud Daneshtalab, Jaan Raik , Maksim Jenihhin , Salvatore Pappalardo , Joachim Paul , Alberto Bosio 27th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Autonomous Realization of Safety-and Time-Critical Embedded Artificial Intelligence (Mar 2024) Joakim Lindén, Andreas Ermedahl, Hans Salomonsson , Masoud Daneshtalab, Bjorn Forsberg , Paris Carbon Design, Automation & Test in Europe Conference (DATE'24)
Analysis and Improvement of Resilience for Long Short-Term Memory Neural Networks (Oct 2023) Mohammad Ahmadilivani , Jaan Raik , Masoud Daneshtalab, Alar Kuusik 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023)
Efficient On-device Transfer Learning using Activation Memory Reduction (Sep 2023) Amin Yoosefi , Seyedhamidreza Mousavi, Masoud Daneshtalab, Mehdi Kargahi International Conference on Fog and Mobile Edge Computing (FMEC)
Enhancing Fault Resilience of QNNs by Selective Neuron Splitting (Jun 2023) Mohammad Ahmadilivani , Javid Taheri , Jaan Raik , Maksim Jenihhin , Masoud Daneshtalab 5th IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS) (AICAS 2023)
DeepVigor: Vulnerability Value Ranges and Factors for DNNs' Reliability Assessment Mohammad Ahmadilivani , Mahdi Taheri , Jaan Raik , Masoud Daneshtalab, Maksim Jenihhin European Test Symposium 2023 (IEEE ETS)
NeuroPIM: Flexible Neural Accelerator for Processing-in-Memory Architectures (May 2023) Ali Monavari , Sepideh Fattahi , Mehdi Modarressi , Masoud Daneshtalab International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors (May 2023) Mahdi Taheri , Mohammad Ahmadilivani , Maksim Jenihhin , Masoud Daneshtalab, Jaan Raik International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
